WAFER COATINGS

Specific X-ray Fluorescence Measuring Instruments (XRF) for Measurements and Analyses of Coating Thicknesses and Compositions on Wafers
The instruments are particularly suitable for measurements on structures on wafers in the electronics and semiconductor industries, Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 μm (0.004 mils) & Determination of complex multi-coating systems Automated measurements, e.g., in quality control

Description / Specification of Coating Thickness Measurement On Connectors

We are involved in offering a wide range of Coating Thickness Measurement On Connectors to our most valued clients. Our range of these are widely appreciated by our clients which are situated all round the nation. We offer our range of it at most affordable prices.

We introduce ourselves as an eminent trader and supplier of an extensive array of  Coating Thickness Measurement On Connectors. Prior to dispatch, our quality controllers run numerous tests on the entire range on various parameters of quality and durability. The offered equipment is manufactured using superior quality components with the aid of sophisticated techniques at the vendors' end. Moreover, our precious clients can purchase it in different technical specifications at reasonable price from us within promised time frame.
Features:

Sturdy design
Highly durable
Application specific design 

Description / Specification of Pvd And Cvd Coating

We are involved in offering a wide range of Pvd And Cvd Coating to our most valued clients. Our range of these are widely appreciated by our clients which are situated all round the nation. We offer our range of it at most affordable prices.

We introduce ourselves as an eminent trader and supplier of an extensive array of  Pvd And Cvd Coating. Prior to dispatch, our quality controllers run numerous tests on the entire range on various parameters of quality and durability. The offered equipment is manufactured using superior quality components with the aid of sophisticated techniques at the vendors' end. Moreover, our precious clients can purchase it in different technical specifications at reasonable price from us within promised time frame.
Features:

Sturdy design
Highly durable
Application specific design 

We are engaged in offering a wide range of bath analysis. These are engineered in accordance with international industrial standard and using best available techniques. These are available with us in various range including plating bath analysis instrument – XUL, bath analysis coating thickness – XDL, bath analysis coating thickness - XAN 250, bath analysis coating thickness - XDV-SDD and bath analysis coating thickness – XDLM.

High Repeatability Precision and Trueness of Au / Pd Coating Measurements on Leadframes along with Specific X-ray Fluorescence Measuring Instruments (XRF) for Measurements and Analyses of Coating Thicknesses and Compositions on Wafers for Measurements on structures on wafers in the electronics and semiconductor industries

Description / Specification of Wires

We are involved in offering a wide range of Wires to our most valued clients. Our range of these are widely appreciated by our clients which are situated all round the nation. We offer our range of it at most affordable prices.

We introduce ourselves as an eminent trader and supplier of an extensive array of  Wires. Prior to dispatch, our quality controllers run numerous tests on the entire range on various parameters of quality and durability. The offered equipment is manufactured using superior quality components with the aid of sophisticated techniques at the vendors' end. Moreover, our precious clients can purchase it in different technical specifications at reasonable price from us within promised time frame.
Features:

Sturdy design
Highly durable
Application specific design 

Production quality of thin film solar cells can be accurately and precisely monitored using the X-Ray Fluorescence (XRF) methodology. Specifically tailored inline measurement instruments are available that fulfil the robustness requirements in production environment. Clever software features enable simple setup and handling of the measurement instruments whilst ensuring stable measurement and maintaining comparability between them.

The combination of state-of-the-art detector technology such as SDD, multiple excitations in various modes, and the powerful analysis software, WinFTM® , allows for reliable, accurate measurements of both coating thickness of electroplated materials and phosphorous content of electroless nickel coatings on a wide variety of substrate materials. The XRF machine unites all these performance features in one instrument.

Watch hands, faces, gear wheels and other visible elements inside high quality watches are often plated with gold or other precious metals that lend the watch its elegant look. Here, not only is the visual effect important but also the precise functioning of the parts. Tight tolerance limits require extremely precise coating thickness measurements, such as those achieved using X-ray fluorescence

Solder joints are engineered using best available techniques and following international industrial standard. These are extensively recommended by clients owing to its precise design and effective usage. These are available in various range including solder joints coating thickness measurement - XDLM 237, solder joints coating thickness measurement - XDV-SDD and solder joints coating thickness measurement - XDV-u

Specific X-ray Fluorescence Measuring Instruments (XRF) for Measurements and Analyses of Coating Thicknesses and Compositions on Printed Circuit Boards. Also determination of copper coating thickness on non-etched or etched PC boards and determination of copper coating thickness in bore holes using handheld instruments.